DFG Project within TRR 404: C03

Materials at Work – Characterization of Devices Under Operating Conditions
Funding period: 2025-28

In most of the new devices researched in TRR 404 there are still uncertainties with respect to the precise device physics. The knowledge about the device physics is, however, indispensable for device optimization, assessing the possibilities and limitations on the circuit and system level, and for developing simulation models. The overarching project combines advanced characterization methods to gain new insights into the device under operating conditions.

This study of materials at work provides advanced characterization, with a focus on operando techniques, to support the device research but also the understanding of the physical mechanisms in the devices that are essential to extrapolate to more complex systems. The broad know-how on novel devices and materials as well as circuit design and architecture available at RWTH Aachen and TUD will be combined to explore a novel 3D integration concept utilizing active devices fabricated in the BEOL for integrated circuits.

To this end, the Dresden Center for Nanoanalysis (DCN) contributes nanoanalytical characterizations by (in-situ and operando) high-resolution transmission electron microscopy (HR-TEM), secondary electron microscopy (SEM), X-ray microscopy and tomography (XCT) including methodical developments and advanced sample preparation.